The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8154617 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 10, 2012

Filed:

Sep. 30, 2009
Applicants:

Yushin Cho, Sunnyvale, CA (US);

Daisuke Hiranaka, Kawasaki, JP;

Jeongnam Youn, San Jose, CA (US);

Inventors:

Yushin Cho, Sunnyvale, CA (US);

Daisuke Hiranaka, Kawasaki, JP;

Jeongnam Youn, San Jose, CA (US);

Assignees:

Sony Corporation, Tokyo, JP;

Sony Electronics Inc., Park Ridge, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); H04N 7/12 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of detecting existence of visually thin lines in images is described herein. The method includes profile generation, profile analysis and deciding the existence of thin lines. The profile generation includes generating a profile in each direction of the input image. Multiple projection lines are projected along the direction and all of the pixel values along the projection lines are added and averaged to obtain a profile. The profile analysis includes determining presence of thin lines in the input image and also noticing if the direction of the thin lines is similar to that of the projection lines. At the third step, according to the analysis made, existence of thin lines in the image is decided.


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