The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Apr. 25, 2008
Motohiro Yagyu, Yamatokoriyama, JP;
Kenichi Kasai, Yamatokoriyama, JP;
Ken Sato, Yamatokoriyama, JP;
Junsuke Yasui, Yamatokoriyama, JP;
Akira Nagao, Yamatokoriyama, JP;
Tetsuhisa Ishida, Yamatokoriyama, JP;
Motohiro Yagyu, Yamatokoriyama, JP;
Kenichi Kasai, Yamatokoriyama, JP;
Ken Sato, Yamatokoriyama, JP;
Junsuke Yasui, Yamatokoriyama, JP;
Akira Nagao, Yamatokoriyama, JP;
Tetsuhisa Ishida, Yamatokoriyama, JP;
Qualicaps Co., Ltd., Nara, JP;
Abstract
An appearance inspection device, which inspects an appearance of test objects, includes a first and second conveying meansandconveying the test objects, a back/front reversal meansturning over the front and back surfaces of the test objects being conveyed by the first conveying meansand supplying the test objects to the second conveying means, and a plurality of image-pickup meansandcapturing images of each test object from upper oblique directions while the test objects are conveyed by the first and second conveying meansand. The appearance inspection device also includes a defect detection means detecting the presence of defects in the test objects based on image data captured by the image-pickup meansand. This appearance inspection device makes it possible to reliably and readily inspect an entire appearance of the test objects.