The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Apr. 20, 2011
Kyoung June Min, Yongin-si, KR;
Jong Myon Kim, Yongin-si, KR;
Hee Seok Kim, Yongin-si, KR;
Jeong Wook Kim, Yongin-si, KR;
Suk Jin Kim, Yongin-si, KR;
Kyoung June Min, Yongin-si, KR;
Jong Myon Kim, Yongin-si, KR;
Hee Seok Kim, Yongin-si, KR;
Jeong Wook Kim, Yongin-si, KR;
Suk Jin Kim, Yongin-si, KR;
Samsung Electronics, Co., Ltd., Suwon-Si, KR;
Abstract
A method and system for an early Z test in a tile-based three-dimensional rendering is provided. In the method and system for an early Z test, a portion which is not displayed to a user is removed prior to performing a rasterization process, and thereby performing the 3D rendering efficiently. The method includes segmenting a scene into tiles for performing a rendering with respect to a triangle; selecting a first tile of the tiles, which has a tile Z value less than a minimum Z value of the triangle; and performing the rendering with respect to the triangle in remaining tiles excluding the selected first tile of the tiles.