The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Dec. 11, 2008
Applicants:
Chris W. Lagerberg, Seattle, WA (US);
Roger Stark, Snohomish, WA (US);
Inventors:
Chris W. Lagerberg, Seattle, WA (US);
Roger Stark, Snohomish, WA (US);
Assignee:
Fluke Corporation, Everett, WA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract
Embodiments of the present invention are directed to adjustable test probe tips that are indexable. In one embodiment a mechanism is coupled to a probe tip so that the mechanism may be used to index the probe tip to a plurality of particular positions. A label portion may be provided to communicate to a user that the length of the exposed probe tip is less than a particular length, such as the maximum length an exposed probe tip may be for a particular application.