The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Jul. 18, 2007
Kaveh Niayesh, Teheran, IR;
Matthias Berth, Zürich, CH;
Andreas Dahlquist, Zürich, CH;
Christoph Heitz, Elgg/ZH, CH;
Martin Tiberg, Genève, CH;
Kaveh Niayesh, Teheran, IR;
Matthias Berth, Zürich, CH;
Andreas Dahlquist, Zürich, CH;
Christoph Heitz, Elgg/ZH, CH;
Martin Tiberg, Genève, CH;
ABB Research Ltd, Zurich, CH;
Abstract
A method and device for determining the linear response of an electrical multi-port component has an 'estimation procedure' in which an estimated admittance matrix is determined by applying voltages to the ports of the component and measuring the response of the component. The estimation procedure can e.g. consist of a conventional measurement of the admittance matrix. The method further has a 'measurement procedure' in which several voltage patterns are applied to the port. The voltage patterns correspond to the eigenvectors of the estimated admittance matrix. For each applied voltage pattern, the response of the component is measured. This allows to measure the linear response of the component accurately even if the eigenvalues of the admittance matrix differ by several orders of magnitude.