The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2012

Filed:

Sep. 16, 2011
Applicants:

Sten Linder, Trosa, SE;

Lennart Thegel, Vasteras, SE;

Inventors:

Sten Linder, Trosa, SE;

Lennart Thegel, Vasteras, SE;

Assignee:

ABB AB, , SE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and an apparatus for measuring the thickness of a metal layer. The metal layer has a resistivity (ρ) that differs from the resistivity (ρ) of the metal object. The apparatus includes a first device arranged to generate a magnetic field in close vicinity of the metal layer, and to generate a variation of the magnetic field so that a current is induced in the surface of the metal layer, a second device arranged to measure the changes of the magnetic field outside the metal layer due to the induced current during a time period that is longer than the time it takes for the current to propagate through the metal layer, and a computing unit to determine the thickness of the layer based on a mathematical relation between the thickness of the layer and the measured values of the changes of the magnetic field.


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