The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 10, 2012
Filed:
Oct. 10, 2008
Ted W. Britton, Sunrise, FL (US);
Jiuliu LU, Homestead, FL (US);
Jeffrey L. Rose, Pembroke Pines, FL (US);
Ted W. Britton, Sunrise, FL (US);
Jiuliu Lu, Homestead, FL (US);
Jeffrey L. Rose, Pembroke Pines, FL (US);
Beckman Coulter, Inc., Brea, CA (US);
Abstract
Methods and systems substantially eliminate data representative of coincident events from particle analyzer data. A fluid sample containing particles for analysis is prepared. Using an electrical or optical measurement device, signals are sensed. Each signal corresponds to events detected in a sub-sample of the fluid sample flowing through a measurement region in the particle analyzer. The existence of coincidence in the events is determined based on measuring a peak and first and second points of each of the signals. The first and second points have a signal value corresponding to a predetermined portion of the peak. Results data based upon the coincident events and non-coincident events is generated. The results data is then analyzed. In various examples, the method is applicable to a variety of particle types, and may be implemented on different types of particle analyzers including hematology analyzer and flow cytometers.