The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8153381 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 10, 2012

Filed:

Apr. 28, 2008
Applicants:

William J. Palin, Cape Elizabeth, ME (US);

Nathan Turner, Portland, ME (US);

Inventors:

William J. Palin, Cape Elizabeth, ME (US);

Nathan Turner, Portland, ME (US);

Assignee:

Alere Scarborough, Inc., Scarborough, ME (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided are methods and devices for determining the strain of a pathogen in a sample.


Find Patent Forward Citations

Palin, William. (2012). Methods for detection of the strain of a pathogen (U.S. Patent No. 8153381). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8153381

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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