The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8152991 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 10, 2012

Filed:

Dec. 08, 2006
Applicants:

Mikhail Briman, Emeryville, CA (US);

Craig Bryant, Alameda, CA (US);

Ying-lan Chang, Cupertino, CA (US);

Jean-christophe P. Gabriel, Pinole, CA (US);

Shirpal C. Gandhi, Los Angeles, CA (US);

Bradley N Johnson, Berkeley, CA (US);

Willem-jan Ouborg, Moraga, CA (US);

John Loren Passmore, Berkeley, CA (US);

Kastooriranganathan Ramakrishnan, San Rafael, CA (US);

Sergei Skarupo, Berkeley, CA (US);

Alexander Star, Pittsburgh, PA (US);

Christian Valcke, Orinda, CA (US);

Inventors:

Mikhail Briman, Emeryville, CA (US);

Craig Bryant, Alameda, CA (US);

Ying-Lan Chang, Cupertino, CA (US);

Jean-Christophe P. Gabriel, Pinole, CA (US);

Shirpal C. Gandhi, Los Angeles, CA (US);

Bradley N Johnson, Berkeley, CA (US);

Willem-Jan Ouborg, Moraga, CA (US);

John Loren Passmore, Berkeley, CA (US);

Kastooriranganathan Ramakrishnan, San Rafael, CA (US);

Sergei Skarupo, Berkeley, CA (US);

Alexander Star, Pittsburgh, PA (US);

Christian Valcke, Orinda, CA (US);

Assignee:

Nanomix, Inc., Emeryville, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of nanoelectronic sensors are described, including sensors for detecting analytes such ammonia. An environmental control system employing nanoelectronic sensors is described. A personnel safety system configured as a disposable badge employing nanoelectronic sensors is described. A method of dynamic sampling and exposure of a sensor providing a number of operational advantages is described.


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