The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8152975 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 10, 2012

Filed:

Mar. 30, 2007
Applicants:

George X. Guo, Palo Alto, CA (US);

Kai-an Wang, Cupertino, CA (US);

Inventors:

George X. Guo, Palo Alto, CA (US);

Kai-an Wang, Cupertino, CA (US);

Assignee:

Ascentool International, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C23C 14/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A target assembly for material deposition includes a first target piece having a first sputtering surface and comprising a first target material that is to be sputtered off the first sputtering surface and to deposit on a substrate. The target assembly also includes a second target piece juxtaposed to the first target piece. The second target piece comprises a second sputtering surface and a second target material that can be sputtered off the second sputtering surface and to deposit on the substrate. The first target piece and the second target piece are configured to be switched in positions and/or orientations after a period of sputtering operations.


Find Patent Forward Citations

Guo, George. (2012). Deposition system with improved material utilization (U.S. Patent No. 8152975). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8152975

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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