The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 10, 2012

Filed:

Oct. 24, 2008
Applicant:

David U. Fluckiger, Allen, TX (US);

Inventor:

David U. Fluckiger, Allen, TX (US);

Assignee:

Raytheon Company, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment, a system for measuring vibration includes multiple spatially separated detectors coupled to a differential signal analyzer and a light source. The light source generates a coherent light beam onto a target that is reflected as backscattered light. The differential signal analyzer receives signals from each of the detectors indicative of backscattered light from the target. The differential signal analyzer then applies a phase shift to a subset of the received signals and combines the phase shifted signals with signals from other detectors to form a differential signal representative of physical vibration of the target.


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