The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Jun. 11, 2008
Thomas Ostrand, Metuchen, NJ (US);
Robert Bell, Murray Hill, NJ (US);
Andrew Gauld, Middletown, NJ (US);
Elaine Weyuker, Metuchen, NJ (US);
Thomas Ostrand, Metuchen, NJ (US);
Robert Bell, Murray Hill, NJ (US);
Andrew Gauld, Middletown, NJ (US);
Elaine Weyuker, Metuchen, NJ (US);
AT&T Intellectual Property I, L.P., Atlanta, GA (US);
Abstract
A method, apparatus, and computer-readable medium for predicting the fault-proneness of code units (files, modules, packages, and the like) of large-scale, long-lived software systems. The method collects information about the code units and the development process from previous releases, and formats this information for input to an analysis stage. The tool then performs a statistical regression analysis on the collected data, and formulates a model to predict fault counts for code units of the current and future releases. Finally, the method computes an expected fault count for each code unit in the current release by applying the formulated model to data from the current release. The expected fault counts are used to rank the release units in descending order of fault-proneness so that debugging efforts and resources can be optimized.