The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Mar. 12, 2008
Hiroyuki Mori, Nagaokakyo, JP;
Yoshihiro Nagao, Fukuchiyama, JP;
Yoshiaki Hiraoka, Ohtsu, JP;
Omron Corporation, Kyoto, JP;
Abstract
A quality improvement system using an FMEA table of the invention includes a defect data collecting unit to collect defect data about a defect in a manufacturing or inspection process and an FMEA table update unit to update the FMEA table online based on the data collected by the defect data collecting unit. The FMEA table includes a failure mode, the number of occurrences of the failure mode, and an effect caused by the failure mode. The FMEA table update unit includes an FMEA table editing unit to edit the FMEA table. The FMEA table editing unit edits the number of occurrences of the failure mode when a row including a set of an occurred failure mode and an effect corresponding to the occurred failure mode is previously defined in the FMEA table, and inserts the row into the FMEA table when the row is not defined in the FMEA table.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile