The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Apr. 12, 2007
Supratim Roy Chaudhury, Santa Clarita, CA (US);
Christopher L. Hogan, Santa Monica, CA (US);
Amitabh Seth, Saratoga, CA (US);
Supratim Roy Chaudhury, Santa Clarita, CA (US);
Christopher L. Hogan, Santa Monica, CA (US);
Amitabh Seth, Saratoga, CA (US);
Yahoo! Inc., Sunnyvale, CA (US);
Abstract
Embodiments of the present invention are directed to identifying a source of bias in a sample set and using statistical techniques to overcome the bias, thereby producing extrapolated data that accurately represents a population including the sample set. The method according to one embodiment comprises identifying a plurality of attributes corresponding to an entity, generating a plurality of clusters from the plurality of attributes, the plurality of clusters including varying numbers of the plurality of attributes, and performing measurements on each of the plurality of clusters to generate measurement data values for each of the plurality of clusters. A cluster with a greatest measurement data value is selected.