The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8150674 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 03, 2012

Filed:

Jun. 02, 2009
Applicants:

Rajan Anand, Edison, NJ (US);

Paritosh Bajpay, Edison, NJ (US);

Inventors:

Rajan Anand, Edison, NJ (US);

Paritosh Bajpay, Edison, NJ (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01); G06F 9/455 (2006.01);
U.S. Cl.
CPC ...
Abstract

A platform for the automated testing of event driven software applications is provided. A source environment is replicated to a target environment. The target environment includes a target system. A test case is defined with a target system, specific attributes and verification information. The attributes of the test case include the target system. The test case is fired. An event is simulated for the test case based on the target system and the specific attributes. The simulated event is transmitted to the target environment. The results of the test case being fired are determined based on verification information. The results are recorded to a data store.


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Anand, Rajan. (2012). Automated testing platform for event driven systems (U.S. Patent No. 8150674). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8150674

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