The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Sep. 12, 2007
Masaya Yamashita, Tokyo, JP;
Toru Kitamura, Tokyo, JP;
Munehiro Kitaura, Tokyo, JP;
Asahi Kasei EMD Corporation, Tokyo, JP;
Abstract
The present invention relates to a physical quantity measuring instrument and signal processing method thereof capable of reducing noise components and improving reliability without increasing size or cost of the circuit. A physical quantity detecting unit () has signal detecting components for detecting a plurality of signals based on a desired physical quantity and detects the desired physical quantity. A signal processing unit () executes signal processing of the signals detected on the individual detecting axes by the physical quantity detecting unit () for linearly combining the signals in different combinations with time. An arithmetic processing unit () combines and calculates a plurality of signals based on the physical quantity associated with the physical quantity detecting unit () from the signal data output by the signal processing unit (). It can linearly combine the signals from the plurality of detecting axes in different combinations with time, output them, and obtain desired signal components whose noise components are reduced by calculating the outputs.