The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Sep. 29, 2008
Ramakrishna C. Dhanekula, San Diego, CA (US);
Keith A. Whisnant, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Ramakrishna C. Dhanekula, San Diego, CA (US);
Keith A. Whisnant, San Diego, CA (US);
Kenny C. Gross, San Diego, CA (US);
Oracle America, Inc., Redwood Shores, CA (US);
Abstract
Some embodiments of the present invention provide a system that characterizes a computer system using a pattern-recognition model. First, values for an environmental parameter are monitored from a set of sensors associated with the computer system. Then, a baseline for the environmental parameter is calculated based on the monitored values from a subset of the set of sensors. Next, the baseline is subtracted from the monitored values from sensors in the set of sensors to produce compensated values. Then, the compensated values are used as inputs to the pattern-recognition model, which produces estimates for the compensated values based on correlations between the compensated values learned during a training phase. Next, residuals are calculated by subtracting the estimates for the compensated values from the compensated values. Then, the residuals are analyzed to characterize the computer system.