The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Dec. 06, 2002
Applicants:

Rudi Labarbe, Cardiff, GB;

Roger Sewell, Cambridge, GB;

Sam Pumphrey, Cambridge, GB;

Inventors:

Rudi Labarbe, Cardiff, GB;

Roger Sewell, Cambridge, GB;

Sam Pumphrey, Cambridge, GB;

Assignee:

GE Healthcare UK Limited, Little Chalfont, GB;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides a method and a measurement system for characterization of luminescence properties, the method comprises irradiating the luminescent material with a pulse of excitation light, providing a triggering signal correlated to the pulse of excitation light; detecting with a photodetector such as a photomultiplier tube (PMT) a plurality of photons emitted from the luminescent material as result of the pulse of excitation light, the photodetector providing an output signal upon the event of detection of a photon; determining for each detected photon a photon arrival time and providing an output suitable for inputting to an analysing module wherein an output comprises zero, one, or more photon arrival time for each excitation, receiving said outputs in an analysing module; and determining in the analysing module, characteristics properties of the luminescent material by performing a statistical analysis based on Bayesian inference.


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