The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Jun. 18, 2008
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Feng Guo, Chicago, IL (US);
Jin-hyeong Park, Princeton, NJ (US);
Gustavo Henrique Monteiro DE Barros Carneiro, Plainsboro, NJ (US);
Constantine Simopoulos, San Francisco, CA (US);
Joanne Otsuki, Oakland, CA (US);
Dorin Comaniciu, Princeton Junction, NJ (US);
John I. Jackson, Menlo Park, CA (US);
Shaohua Kevin Zhou, Plainsboro, NJ (US);
Feng Guo, Chicago, IL (US);
Jin-hyeong Park, Princeton, NJ (US);
Gustavo Henrique Monteiro de Barros Carneiro, Plainsboro, NJ (US);
Constantine Simopoulos, San Francisco, CA (US);
Joanne Otsuki, Oakland, CA (US);
Dorin Comaniciu, Princeton Junction, NJ (US);
John I. Jackson, Menlo Park, CA (US);
Siemens Corporation, Iselin, NJ (US);
Abstract
A method and system for detection of deformable structures in medical images is disclosed. Deformable structures can represent blood flow patterns in images such as Doppler echocardiograms. A probabilistic, hierarchical, and discriminant framework is used to detect such deformable structures. This framework integrates evidence from different primitive levels via a progressive detector hierarchy, including a series of discriminant classifiers. A target deformable structure is parameterized by a multi-dimensional parameter, and primitives or partial parameterizations of the parameter are determined. An input image is received, and a series of primitives are sequentially detected using the progressive detector hierarchy, in which each detector or classifier detects a corresponding primitive. The final detector detects configuration candidates for the deformable structure.