The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Apr. 30, 2008
Applicants:

Wencheng Wu, Webster, NY (US);

Rajinderjeet Minhas, Churchville, NY (US);

Meera Sampath, Rochester, NY (US);

Inventors:

Wencheng Wu, Webster, NY (US);

Rajinderjeet Minhas, Churchville, NY (US);

Meera Sampath, Rochester, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); H04N 1/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for automated image quality based diagnosis of a document printing system is disclosed. The method comprises receiving image data to be printed on a document; printing an image on the document based on the image data; scanning the printed image on the document with a sensor; analyzing the scanned printed image with an image quality analysis module to identify one or more defects in the printed image; automatically generating test pattern image data based on the one or more identified defects; and printing and analyzing a test pattern image based on the test pattern image data.


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Wu, Wencheng. (2012). Printer characterization, monitoring and diagnosis using dynamic test patterns generated by sensing and analyzing customer documents (U.S. Patent No. 8150106). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8150106

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