The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
May. 22, 2009
Zahid F. Mian, Loudonville, NY (US);
Robert W. Foss, Cohoes, NY (US);
Zahid F. Mian, Loudonville, NY (US);
Robert W. Foss, Cohoes, NY (US);
International Electronic Machines Corporation, Troy, NY (US);
Abstract
A three-dimensional profile of at least a portion of an object, such as a vehicle, is generated using image data corresponding to the object. The image data can be acquired as the object passes an inspection location and can be enhanced using emitted electromagnetic radiation or the like. The three-dimensional profile is analyzed to identify any anomalies that are associated with the object. The analysis can include comparing the three-dimensional profile to a standard three-dimensional profile corresponding to a type of the object. Further, the analysis can include comparing the three-dimensional profile to a previously acquired three-dimensional profile for the object. The three-dimensional profile can be generated using visible light-based image data, and one or more additional profiles based on non-visible data also can be generated and analyzed.