The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Apr. 02, 2009
Applicant:

Kunikazu Ohnishi, Yokosuka, JP;

Inventor:

Kunikazu Ohnishi, Yokosuka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/135 (2012.01);
U.S. Cl.
CPC ...
Abstract

Undesired disturbance components leak eventually into various detection signals and reproduction signals as stray optical beams reflected from recording layers other than a reproduction layer overlap with signal beams on a light reception surface of an optical detector and interference occurs between them when an optical disc having multi-layered recording layers is reproduced. A diffraction grating having a specific grating groove pattern is arranged immediately ahead of an optical detector or in a return optical path. Such optical unit averages the disturbance components resulting from interference between a signal beam and a stray beam and can satisfactorily improve influences of leak.


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