The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Feb. 02, 2010
Applicants:
Hee-il Hong, Seongnam-si, KR;
Kang-young Cho, Suwon-si, KR;
Inventors:
Hee-Il Hong, Seongnam-si, KR;
Kang-Young Cho, Suwon-si, KR;
Assignee:
Samsung Electronics Co., Ltd., Suwon-Si, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 7/00 (2006.01); G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Provided is a semiconductor device capable of effectively testing whether memory cells and a memory cell array are defective. The semiconductor device may include a memory cell array having a plurality of memory cells and an external test pad connected to an internal test pad. A test voltage may be applied to the plurality of word lines connected to the plurality of memory cells via the external test pad and the internal test pad in a test mode, wherein the test voltage disables the plurality of word lines.