The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Oct. 17, 2008
Peter Michael Baumgart, San Jose, CA (US);
Jia-yang Juang, Santa Clara, CA (US);
Gurinder Pal Singh, San Jose, CA (US);
Peter Michael Baumgart, San Jose, CA (US);
Jia-Yang Juang, Santa Clara, CA (US);
Gurinder Pal Singh, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A system according to one embodiment includes a thin film stack having a magnetic transducer and a contact pad; and a heater in the thin film stack for inducing thermal protrusion of a media-facing side of the thin film stack, wherein the thin film stack is characterized by the contact pad protruding farther than the magnetic transducer upon the thin film stack being heated by the heater. A method for calibrating a protrusion of a magnetic head includes increasing a thermal protrusion of a magnetic head to induce head-medium contact; determining that the head has contacted the medium, wherein a portion of the head that contacts the medium is a contact pad or overcoat of the contact pad; determining parameters for inducing a desired amount of protrusion based in part on the determination that the head has contacted the medium; and storing the parameters.