The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Feb. 21, 2008
Xinyu Fan, Ibaraki, JP;
Fumihiko Ito, Ibaraki, JP;
Yusuke Koshikiya, Ibaraki, JP;
Nippon Telegraph and Telephone Corporation, Tokyo, JP;
Abstract
An object of the invention is to provide an optical reflectometry and an optical reflectometer, in which accurate measurement can be performed irrespective of a measurement distance. In the optical reflectometry and optical reflectometer according to the invention, in which a distribution of backscattered light intensity from a measurement target in an optical propagation direction is measured using Optical Frequency Domain Reflectometry (OFDR), a coherence monitor unitthat monitors a coherence property of a frequency sweep light sourceis provided, and measurement result of a measuring unitis corrected based on the monitor result of the coherence monitor unit