The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Dec. 29, 2008
Applicants:

Daniel Kaplan, Paris, FR;

Thomas Oksenhendler, Gometz le Chatel, FR;

Nicolas Forget, Orsay, FR;

Inventors:

Daniel Kaplan, Paris, FR;

Thomas Oksenhendler, Gometz le Chatel, FR;

Nicolas Forget, Orsay, FR;

Assignee:

Fastlite, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The method and device for measuring the spectral phase or combined spectral and spatial phases of ultra short light pulses, consisting of a decomposition of the light pulse to be measured in two identical replicas called signal pulse and primary reference pulse, respectively, of different polarization or direction and the phase characteristics of which are essentially identical to the original pulse, a temporal filtering of the primary reference pulse by a nonlinear interaction generating a secondary reference pulse of average frequency essentially identical and of spectral width greater than the spectral width of the primary reference pulse, and a spectral interferometry measurement by recombination of this secondary reference pulse and the signal pulse with a given temporal offset.


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