The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Oct. 10, 2007
Hiromichi Ohashi, Ibaraki, JP;
Hiromichi Ohashi, Ibaraki, JP;
Nitto Denko Corporation, Ibaraki-shi, Osaka, JP;
Abstract
The test data processing apparatus of the present invention is a test data processing apparatus for processing test data obtained by testing defects of a sheet-shaped product having at least an optical film which is a member of an optical displaying apparatus, comprising a defect information preparing section, wherein, on the basis of surface defect test data relating to a surface defect and bright point test data relating to a bright point obtained when the optical film or a laminate body containing the optical film is regarded as an object of testing, in a case that a position of the surface defect and a position of the bright point are identical, the surface defect and the bright point located at the identical position are not regarded as a defect for processing by the defect information preparing section.