The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

May. 06, 2008
Applicants:

Tomonori Hayakawa, Komaki, JP;

Tetsuyoshi Shibata, Kitanagoya, JP;

Rentaro Kato, Kasugai, JP;

Kazunobu Hashimoto, Nagoya, JP;

Yo Kato, Nagoya, JP;

Toshiharu Mukai, Nagoya, JP;

Inventors:

Tomonori Hayakawa, Komaki, JP;

Tetsuyoshi Shibata, Kitanagoya, JP;

Rentaro Kato, Kasugai, JP;

Kazunobu Hashimoto, Nagoya, JP;

Yo Kato, Nagoya, JP;

Toshiharu Mukai, Nagoya, JP;

Assignees:

Tokai Rubber Industries, Ltd., Komaki-shi, JP;

Riken, Wako-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/045 (2006.01);
U.S. Cl.
CPC ...
Abstract

A deformable sensor system that can be used for pressure-distribution sensors. The deformable sensor system makes it possible to obtain a pressure distribution with a much higher accuracy, while reducing the number of electrodes. The system utilizes a deformable sensor which can detect deformation as the electric resistivity of the surface increases monotonically as an elastic deformation variation in each of the elastic deformations increases. Based on a voltage being detected by means of a detecting unit, the deformable sensor electric-resistivity variation computing unit computes the variation of the electric resistivity based on the method of least squares with a restriction condition imposed thereon. The system uses such a technology as 'EIT' that is based on an inverse-problem theory. At an external-force position computing unit, a position in a pressure-receiving surface, position which receives an external force, is computed based on the computed electric-resistivity variation.


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