The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Dec. 18, 2008
Applicant:

Takehiro Kawai, Kyoto, JP;

Inventor:

Takehiro Kawai, Kyoto, JP;

Assignee:

Omron Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of measuring a range from a reader unit to a non-contacted IC medium, includes: transmitting an inquiry signal at a first frequency from the reader unit to the non-contacted IC medium; causing the non-contacted IC medium to perform modulation to modulate the first frequency by using a second frequency to obtain a modulated frequency, and causing the non-contacted IC medium to respond to a response signal at the modulated frequency; causing the reader unit to receive the response signal to acquire a plurality of frequency components; calculating a phase difference between signals of at least two of the acquired plurality of frequency components; and measuring the range by using the phase difference.


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