The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8149006 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 03, 2012

Filed:

Dec. 04, 2006
Applicants:

Hiroshi Nakayama, Nagano, JP;

Mitsuhiro Nagaya, Nagano, JP;

Yoshio Yamada, Nagano, JP;

Inventors:

Hiroshi Nakayama, Nagano, JP;

Mitsuhiro Nagaya, Nagano, JP;

Yoshio Yamada, Nagano, JP;

Assignee:

NHK Spring Co., Ltd., Yokohama-shi, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A probe card includes probes that come into contact with a semiconductor wafer to receive or output an electric signal; a probe head that holds the probes; a substrate that has a wiring pattern corresponding to a circuit structure for generating a signal for a test; a reinforcing member that reinforces the substrate; an interposer that is stacked on the substrate and includes a housing having connection terminals resilient in an axial direction thereof and hole portions each housing one of the connection terminals; and a space transformer that is stacked between the interposer and the probe head and transforms intervals among the wires.


Find Patent Forward Citations

Nakayama, Hiroshi. (2012). Probe card (U.S. Patent No. 8149006). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8149006

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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