The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Sep. 29, 2009
Applicants:

Florian Bauer, Erlangen, DE;

Lars A. Eriksson, Oak Ridge, TN (US);

Ronald Grazioso, Knoxville, TN (US);

Charles L. Melcher, Oak Ridge, TN (US);

Harold E. Rothfuss, Knoxville, TN (US);

Inventors:

Florian Bauer, Erlangen, DE;

Lars A. Eriksson, Oak Ridge, TN (US);

Ronald Grazioso, Knoxville, TN (US);

Charles L. Melcher, Oak Ridge, TN (US);

Harold E. Rothfuss, Knoxville, TN (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A phoswich device for determining depth of interaction (DOI) includes a first scintillator having a first scintillation decay time characteristic, a second scintillator having a second scintillation decay time characteristic substantially equal to the first scintillation decay time, a photodetector coupled to the second scintillator, and a wavelength shifting layer coupled between the first scintillator and the second scintillator, wherein the wavelength shifting layer modifies the first scintillation decay time characteristic of the first scintillator to enable the photodetector to differentiate between the first decay time characteristic and the second decay time characteristic. The phoswich device is particularly applicable to positron emission tomography (PET) applications.


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