The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Jun. 14, 2010
Applicants:

Wei-song Hung, Chung-Li, TW;

Manuel DE Guzman, Chung-Li, TW;

Shu-hsien Huang, I-Lan, TW;

Kueir-rarn Lee, Chung-Li, TW;

Yan-ching Jean, Kansas City, MO (US);

Juin-yih Lai, Chung-Li, TW;

Inventors:

Wei-Song Hung, Chung-Li, TW;

Manuel De Guzman, Chung-Li, TW;

Shu-Hsien Huang, I-Lan, TW;

Kueir-Rarn Lee, Chung-Li, TW;

Yan-Ching Jean, Kansas City, MO (US);

Juin-Yih Lai, Chung-Li, TW;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention discloses a method for characterizing a membrane in a wet condition using a positron annihilation spectrometer and a sample holder thereof. Positron annihilation lifetime spectroscopy (PALS) has been know to be an invaluable tool for investigating local free-volume hole properties in various materials. Accompanying with the method and sample holder disclosed by the invention, PAS and PALS can measure the properties of various materials, such as free volume and layer structures both in the dry and wet states.


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