The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Mar. 28, 2007
Applicants:

Takaaki Nagai, Kobe, JP;

Hideaki Matsumoto, Takasago, JP;

Yuichi Hamada, Kobe, JP;

Inventors:

Takaaki Nagai, Kobe, JP;

Hideaki Matsumoto, Takasago, JP;

Yuichi Hamada, Kobe, JP;

Assignee:

Sysmex Corporation, Hyogo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); G01N 21/00 (2006.01); G01N 33/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A sample measuring apparatus of measuring a component in a biological sample, comprising: an input section for inputting a sample species of a biological sample; a measurement sample preparation section for preparing a measurement sample by mixing the biological sample with a reagent; a first measurement section; a second measurement section being different from the first measurement section; a measurement sample supply section for supplying the measurement sample prepared in the measurement sample preparation section to at least one of the first measurement section and second measurement section; and a control section for controlling the measurement sample supply section based on the inputted sample species.


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