The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 03, 2012
Filed:
Jun. 02, 2004
Gary T. Neel, Weston, FL (US);
Brent E. Modzelewski, Brockfield, CT (US);
Cameron Scott Casterline, Pembroke Pines, FL (US);
Gary T. Neel, Weston, FL (US);
Brent E. Modzelewski, Brockfield, CT (US);
Cameron Scott Casterline, Pembroke Pines, FL (US);
Nipro Diagnostics, Inc., Fort Lauderdale, FL (US);
Abstract
A system for diagnostic testing may include a meter for performing a diagnostic test on a sample applied to a test media and a container configured to contain test media compatible with the meter. The meter may include a closure portion for selectively closing the opening of the container. The system may also provide mechanisms to disable a power source, an auto-on function of the meter, a diagnostic testing function of the meter, or other function of the meter when it has been determined that a triggering event has occurred. The system may further provide mechanisms to reconfigure the meter to perform a new function when it has been determined that the triggering event has occurred.