The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Mar. 01, 2007
Applicants:

Dan Hashimshony, Givat Ada, IL;

Gal Aharonowitz, Moshav Gan Haim, IL;

Gil Cohen, Jerusalem, IL;

Iddo Geltner, Herzlia, IL;

Inventors:

Dan Hashimshony, Givat Ada, IL;

Gal Aharonowitz, Moshav Gan Haim, IL;

Gil Cohen, Jerusalem, IL;

Iddo Geltner, Herzlia, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A measurement system and method are provided for use in characterizing a tissue. The system comprises a probe adapted for operating in either a scan mode or a measure mode, and a control unit for operating the probe. The probe comprises a sensing module for measuring one or more parameters indicative of one or more states of the tissue; and an attachment module configured and operable to enable selective operation of the probe in either one of the scan mode and the measure modes. The control unit is configured and operative to selectively operate the probe in either one of the scan and measure modes.


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