The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 03, 2012

Filed:

Feb. 11, 2008
Applicants:

James W. Moore, Renton, WA (US);

Danny S. Barnes, Maple Valley, WA (US);

Matthew E. Allen, Liberty Lake, WA (US);

Bruce R. Scharf, Seattle, WA (US);

Inventors:

James W. Moore, Renton, WA (US);

Danny S. Barnes, Maple Valley, WA (US);

Matthew E. Allen, Liberty Lake, WA (US);

Bruce R. Scharf, Seattle, WA (US);

Assignee:

Microscan Systems, Inc., Renton, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of a method, apparatus, and article of manufacture for rapidly capturing images in an automated identification system to effectively extend one dimension of a field of view of an image system are disclosed herein. In one embodiment, the image system captures and processes multiple images of at least a portion of a surface of a component in the automated identification system in response to a trigger signal communicated from a triggering device configured to sense a location of the component. Various embodiments of the invention include multiple sources for capturing images, and/or multiple user-specified schemas for effectively extending the field of view of the image system along the axis of component travel in the automated identification system.


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