The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2012

Filed:

Aug. 31, 2010
Applicants:

Adityo Prakash, Redwood Shores, CA (US);

Edward R. Ratner, Sunnyvale, CA (US);

Dimitrios Antsos, San Marino, CA (US);

Inventors:

Adityo Prakash, Redwood Shores, CA (US);

Edward R. Ratner, Sunnyvale, CA (US);

Dimitrios Antsos, San Marino, CA (US);

Assignee:

Altera Corporation, San Jose, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, an image is broken up into multiple regions or segments, where each segment may be of arbitrary shape, and a transform (multi-scale or otherwise) is applied on the set of segments. In another embodiment, pattern adaptive prediction is used when predicting the next finer level of the transform pyramid. The pattern adaptive prediction uses the parent grid to determine what geometry of a filter is to be used when predicting the child grid. At the boundaries of the domain, the pattern adaptive prediction can coupled with the domain adaptive prediction technique.


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