The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2012
Filed:
Apr. 13, 2006
Christian Adrian Cocosco, Hamburg, DE;
Stewart Young, Hamburg, DE;
Thomas Netsch, Eindhoven, NL;
Michael Kaus, Toronto, CA (US);
Christian Adrian Cocosco, Hamburg, DE;
Stewart Young, Hamburg, DE;
Thomas Netsch, Eindhoven, NL;
Michael Kaus, Toronto, CA (US);
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A method is arranged to segment a surface in a multi-dimensional dataset comprising a plurality of images. Data processing and data acquisition steps can be temporally or geographically distanced, so that the results of a suitable data segmentation are accessed. Next, suitable plurality of image features resembling possible spatial positions of the surface conceived to be segmented are selected and accessed. The features are subsequently matched for all image portions, whereby for each feature a matching error is assigned. A pre-defined selectivity factor is accessed defining a maximum allowable variable fraction of the features having largest matching errors which can be discarded. The segmentation of the sought surface is performed, whereby the discarded features are not taken into account for evaluating the quality of fit of a candidate deformation. The resulting surface is displayed on a suitable display means.