The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8144943 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 27, 2012

Filed:

Jul. 23, 2007
Applicants:

Satoshi Yashiro, Yokohama, JP;

Kotaro Yano, Tokyo, JP;

Yumi Watanabe, Yokohama, JP;

Inventors:

Satoshi Yashiro, Yokohama, JP;

Kotaro Yano, Tokyo, JP;

Yumi Watanabe, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/32 (2006.01);
U.S. Cl.
CPC ...
Abstract

A plurality of collation patterns having different resolutions are generated from an original collation pattern which includes a plurality of local regions. Subject reliabilities for individual local regions are calculated based on local features of the local regions in the collation patterns having different resolutions. In accordance with the subject reliabilities for individual local regions, it is determined that the original collation pattern includes a specific image of a subject.


Find Patent Forward Citations

Yashiro, Satoshi. (2012). Apparatus and method for detecting specific subject in image (U.S. Patent No. 8144943). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8144943

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