The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2012

Filed:

May. 18, 2007
Applicants:

Murali Paravath Menon, Somerville, MA (US);

Mark S. Wallace, Bedford, MA (US);

Inventors:

Murali Paravath Menon, Somerville, MA (US);

Mark S. Wallace, Bedford, MA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03D 3/00 (2006.01); H03K 9/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

Techniques for estimating signal quality in a communication system are described. Scaled errors are obtained for inphase (I) and quadrature (Q) components of detected symbols. The scaled errors are determined based on a first function having higher resolution for small errors than large errors between the detected symbols and nearest modulation symbols. The first function may be a square root function or some other function that can provide good resolution for both low and high SNRs. The scaled errors for the I and Q components are combined to obtain combined scaled errors, which are averaged to obtain an average scaled error. A signal quality estimate is then determined based on the average scaled error and in accordance with a second function having non-linearity to compensate for the first function.


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