The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2012
Filed:
Jul. 23, 2008
Joel M. Morris, Columbia, MD (US);
Ronald Hozloehner, Munich, DE;
Amitkumar Mahadevan, Baltimore, MD (US);
Curtis R. Menyuk, Silver Spring, MD (US);
John W. Zweck, Columbia, MD (US);
Joel M. Morris, Columbia, MD (US);
Ronald Hozloehner, Munich, DE;
Amitkumar Mahadevan, Baltimore, MD (US);
Curtis R. Menyuk, Silver Spring, MD (US);
John W. Zweck, Columbia, MD (US);
University of Maryland, Baltimore County, Baltimore, MD (US);
Abstract
A dual adaptive importance-sampling system and method is provided that can estimate the probability of events by combining dual complementary importance-sampling simulations. The present invention exploits the ability to determine an optimal biased pdf using an iterative procedure that requires relatively little a priori knowledge of how to bias. Hence, the present invention is particularly suited for evaluating the BERs and/or WERs of coded communication and storage systems, and is generally applicable to arbitrarily chosen codes. When applied to coded communication and storage systems, the present invention provides a versatile technique for the fast and accurate estimation of BERs and WERs of FEC codes down to values of 10or lower.