The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8144599 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 27, 2012

Filed:

Apr. 22, 2005
Applicant:

Eero Wallenius, Kangasala, FI;

Inventor:

Eero Wallenius, Kangasala, FI;

Assignee:

Nokia Corporation, Espoo, FI;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention concerns binary class based analyzing and monitoring. Data relating to indicators relating to at least one of: a communications network resource, a communications network service, and a service provided over a communications network, is collected. Value ranges of the indicators are divided into value range classes, and a binary code is assigned to each class. The collected data is classified by translating each piece of the collected data into the binary code assigned to its associated value range class. The classified data is monitored for changes. The invention allows significantly faster analyzing and monitoring of a communications network, network resources, network services and services provided over the network.


Find Patent Forward Citations

Wallenius, Eero. (2012). Binary class based analysis and monitoring (U.S. Patent No. 8144599). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8144599

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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