The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2012

Filed:

Apr. 02, 2008
Applicants:

Masaharu Tomioka, Hino, JP;

Akinori Araya, Yokohama, JP;

Toshiyuki Hattori, Hachioji, JP;

Yasunari Matsukawa, Saitama, JP;

Tatsuo Nakata, Hino, JP;

Inventors:

Masaharu Tomioka, Hino, JP;

Akinori Araya, Yokohama, JP;

Toshiyuki Hattori, Hachioji, JP;

Yasunari Matsukawa, Saitama, JP;

Tatsuo Nakata, Hino, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

An image can be prevented from becoming unclear over time during long-term observation. The invention provides a microscope apparatus including a specimen container for containing a specimen; an objective lens disposed opposite the specimen container for collecting light from the specimen in the specimen container; an immersion-liquid supplying unit for supplying immersion liquid to a space between the objective lens and the specimen container; and an immersion-liquid removing unit for removing the immersion liquid from the space between the objective lens and the specimen container. The immersion-liquid removing unit includes a nozzle for ejecting compressed air to the space between the objective lens and the specimen container.


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