The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2012
Filed:
Dec. 10, 2009
Yi-yuh Hwang, Taoyuan, TW;
Chih-ming Liao, Taoyuan, TW;
Chin-der Hwang, Jhubei, TW;
Shin-i MA, Longtan Township, Taoyuan County, TW;
Ting-wei Chiang, Banciao, TW;
Chun-hao Chen, Tucheng, TW;
Wen-cheng Huang, Taipei, TW;
Mau-ran Wang, Taipei, TW;
Yi-Yuh Hwang, Taoyuan, TW;
Chih-Ming Liao, Taoyuan, TW;
Chin-Der Hwang, Jhubei, TW;
Shin-I Ma, Longtan Township, Taoyuan County, TW;
Ting-Wei Chiang, Banciao, TW;
Chun-Hao Chen, Tucheng, TW;
Wen-Cheng Huang, Taipei, TW;
Mau-Ran Wang, Taipei, TW;
Chung Shan Institute of Science and Technology, Armaments Bureau, M.N.D., Taoyuan County, TW;
Abstract
A method and system for positioning by using optical speckle are disclosed in this invention. A highly coherent laser light irradiates a positioning template in advance to record optical speckles caused by interference by scattered light beams from the positioning template for establishing a speckle database. Furthermore, a reference point is defined to position each recorded speckle. Therefore, a coordinate with respect to the reference point corresponding to a specified speckle can be used to position a target or applied to distance measurement by the speckle database. The precision of the speckles according to the present invention is within several micrometers. Hence, it can provide high precision positioning.