The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2012

Filed:

Apr. 22, 2010
Applicants:

Chung-chi Wang, Taipei, TW;

Yi-jian Lee, Taipei, TW;

Inventors:

Chung-Chi Wang, Taipei, TW;

Yi-Jian Lee, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/16 (2006.01); G01J 1/10 (2006.01); H04N 5/228 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to a method of calibrating sensitivity gain. In a preview mode, an imaging device is calibrated by a standard light source, therefore obtaining standard sensitivity gain of the preview mode. In a capture mode, the imaging device is calibrated by the standard light source, therefore obtaining standard sensitivity gain of the capture mode. A gain ratio of the standard sensitivity gain of the capture mode to the standard sensitivity gain of the preview mode is determined, and is then used to deduce the exposure parameters of the capture mode according to the exposure parameters of the preview mode.


Find Patent Forward Citations

Wang, Chung-Chi. (2012). Method of calibrating sensitivity gain (U.S. Patent No. 8144318). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8144318

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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