The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8144316 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 27, 2012

Filed:

Oct. 01, 2009
Applicants:

Seong Chong Park, Daejeon, KR;

Seung Nam Park, Daejeon, KR;

Dong Hoon Lee, Daejeon, KR;

Inventors:

Seong Chong Park, Daejeon, KR;

Seung Nam Park, Daejeon, KR;

Dong Hoon Lee, Daejeon, KR;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an instrument and method for measuring total luminous flux of luminous elements, which forms an approximately uniform spatial intensity distribution by simultaneously lighting a plurality of luminous elements for measurement in an integrating sphere when comparing a total luminous flux standard lamp with the luminous elements to measure the total luminous flux of the luminous elements, thus not requiring spatial mismatch error correction.


Find Patent Forward Citations

Park, Seong. (2012). Instrument and method for measuring total luminous flux of luminous elements (U.S. Patent No. 8144316). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8144316

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