The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2012
Filed:
Aug. 08, 2007
Daisuke Kotake, Yokohama, JP;
Toshihiro Nakazawa, Yokohama, JP;
Masahiro Suzuki, Kawasaki, JP;
Rika Takemoto, Kawasaki, JP;
Kiyohide Satoh, Kawasaki, JP;
Yoshihiko Iwase, Kawasaki, JP;
Daisuke Kotake, Yokohama, JP;
Toshihiro Nakazawa, Yokohama, JP;
Masahiro Suzuki, Kawasaki, JP;
Rika Takemoto, Kawasaki, JP;
Kiyohide Satoh, Kawasaki, JP;
Yoshihiko Iwase, Kawasaki, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
In position and orientation measurement based on natural features, erroneous detection of the natural features is prevented when an observation target object is occluded by another object, and registration stability is improved. To this end, an occluding object that can occlude the observation target object is defined, and an occluding region where the occluding object occludes the observation target object is detected in an input captured image. Image features of the observation target object are detected in a region of the captured image other than the detected occluding region. Therefore, the position or orientation of an image pickup apparatus that captured the captured image, or the position or orientation of the observation target object in the captured image are calculated.