The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 27, 2012

Filed:

Nov. 13, 2009
Applicants:

Jacques Goldberg, Haifa, IL;

Isaac Shpantzer, Bethesda, MD (US);

Yaakov Achiam, Rockville, MD (US);

Nadya Reingand, Baltimore, MD (US);

Inventors:

Jacques Goldberg, Haifa, IL;

Isaac Shpantzer, Bethesda, MD (US);

Yaakov Achiam, Rockville, MD (US);

Nadya Reingand, Baltimore, MD (US);

Assignee:

CeLight, Inc., Silver Spring, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for high Z substance revealing using muon detection technique is presented. Natural muon coordinate and incidence angle are measured above and below the interrogated volume. The muon deviations after passing through the interrogated volume are compared with the reference deviations obtained for the same volume in absence of high Z material. A correlation between the actual data and reference data is calculated using Kolmogorov-Smirnov test, though other approaches may apply. The correlation is used for the decision making on the presence of a nuclear substance inside the volume.


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