The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 27, 2012
Filed:
Dec. 17, 2008
Jongwoo Lim, Sunnyvale, CA (US);
Jongwoo Lim, Sunnyvale, CA (US);
Honda Motor Co., Ltd., Tokyo, JP;
Abstract
A system and method are disclosed for generating an optimized projection pattern and for using the optimized projection pattern for depth reconstruction. The system includes a De Bruijn graph generation module, a non-recurring De Bruijn sequence generation module and projection pattern generation module. The De Bruijn graph generation module is configured to generate a classical De Bruijn graph. The non-recurring De Bruijn sequence generation module is configured to generate a non-recurring De Bruijn sequence by eliminating nodes with recurring alphabets from the classical De Bruijn sequence and calculating a Hamiltonian cycle of the modified De Bruijn graph. The projection pattern generation module is configured to generate the optimized projection pattern form the non-recurring De Bruijn sequence. The system further comprises a projector to project the non-recurring De Bruijn sequence to a plurality of images and a depth reconstruction module to reconstruct depth images from the plurality of the images.