The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 20, 2012
Filed:
Aug. 27, 2009
Nathan C. Buck, Essex Junction, VT (US);
Brian M. Dreibelbis, Essex Junction, VT (US);
John P. Dubuque, Essex Junction, VT (US);
Eric A. Foreman, Essex Junction, VT (US);
Peter A. Habitz, Essex Junction, VT (US);
Jeffrey G. Hemmett, Essex Junction, VT (US);
Susan K. Lichtensteiger, Essex Junction, VT (US);
Natesan Venkateswaran, Hopewell Junction, NY (US);
Chandramouli Visweswariah, Hopewell Junction, NY (US);
Xiaoyue Wang, Kanata, CA;
Nathan C. Buck, Essex Junction, VT (US);
Brian M. Dreibelbis, Essex Junction, VT (US);
John P. Dubuque, Essex Junction, VT (US);
Eric A. Foreman, Essex Junction, VT (US);
Peter A. Habitz, Essex Junction, VT (US);
Jeffrey G. Hemmett, Essex Junction, VT (US);
Susan K. Lichtensteiger, Essex Junction, VT (US);
Natesan Venkateswaran, Hopewell Junction, NY (US);
Chandramouli Visweswariah, Hopewell Junction, NY (US);
Xiaoyue Wang, Kanata, CA;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An approach for covering multiple selective timing corners in a single statistical timing run is described. In one embodiment, a single statistical timing analysis is run on the full parameter space that covers unlimited process parameters/environment conditions. Results from the statistical timing analysis are projected for selected corners. Timing closure is performed on the corners having the worst slacks.